![Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF](https://c5.rgstatic.net/m/4671872220764/images/template/default/profile/profile_default_m.jpg)
Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF
![PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/85a25301661db8d690501e3d9c7f0e65e07f98f3/5-Table1-1.png)
PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar
![PDF) Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies PDF) Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies](https://i1.rgstatic.net/publication/221059882_Resistive-Open_Defect_Injection_in_SRAM_Core-Cell_Analysis_and_Comparison_Between_013_um_and_90_nm_Technologies/links/00b7d527a11617bac7000000/largepreview.png)
PDF) Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies
![PDF) Internal Write-Back and Read-Before-Write Schemes to Eliminate the Disturbance to the Half-Selected Cells in SRAMs PDF) Internal Write-Back and Read-Before-Write Schemes to Eliminate the Disturbance to the Half-Selected Cells in SRAMs](https://i1.rgstatic.net/publication/322955903_Internal_Write-Back_and_Read-Before-Write_Schemes_to_Eliminate_the_Disturbance_to_the_Half-Selected_Cells_in_SRAMs/links/5aa37780aca272d448b6d0ea/largepreview.png)
PDF) Internal Write-Back and Read-Before-Write Schemes to Eliminate the Disturbance to the Half-Selected Cells in SRAMs
![Fault detection as a function of the cycle time, defect size and number... | Download Scientific Diagram Fault detection as a function of the cycle time, defect size and number... | Download Scientific Diagram](https://www.researchgate.net/profile/Luigi_Dilillo/publication/232654450/figure/fig4/AS:668495394140162@1536393130139/Fault-detection-as-a-function-of-the-cycle-time-defect-size-and-number-of-a-read.png)
Fault detection as a function of the cycle time, defect size and number... | Download Scientific Diagram
![PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/85a25301661db8d690501e3d9c7f0e65e07f98f3/3-Figure1-1.png)
PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar
![Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF](https://www.researchgate.net/images/template/default_publication_preview_large.png)
Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF
![PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar](https://ai2-s2-public.s3.amazonaws.com/figures/2017-08-08/85a25301661db8d690501e3d9c7f0e65e07f98f3/4-Figure2-1.png)
PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar
![PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/85a25301661db8d690501e3d9c7f0e65e07f98f3/5-Table2-1.png)